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- Stanford graduate school class CS230 Fall 2019 Project, by SCPD students, Jie and Chen,
- Thanks to Ben M. for suggesting this topic and also patiently walking me through the automated optical inspection industry.
- Wafer Defect Inspection
- Citable DOI: 10.5281/zenodo.10981906 Reuploaded due to YouTube error in audio/video sync in final 30 mins; original video ...
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Wafer defect analysis example Increase the accuracy and efficiency of surface RWMAP is a powerful Wafer
V3-S32.1. Part 1: Course Description: This course explores the critical role of
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