Understanding Wafer Defect Localization And Classification Using Deep Learning Techniques
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Detailed Analysis of Wafer Defect Localization And Classification Using Deep Learning Techniques
Stanford graduate school class CS230 Fall 2019 Project, by SCPD students, Jie and Chen, Using Stanford graduate school class CS230 Fall 2019 Project, by SCPD students, Jie and Chen,
298B Group5 Used WM811K and WM38 dataset. Merged them and annotated the
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